Quantitative criteria for the detection and characterization of nanocrystals from high-resolution electron microscopy images
Author:
Publisher
Informa UK Limited
Subject
Metals and Alloys,Physics and Astronomy (miscellaneous),Condensed Matter Physics,General Materials Science,Electronic, Optical and Magnetic Materials
Link
http://www.tandfonline.com/doi/pdf/10.1080/01418619508243789
Reference15 articles.
1. High-resolution electron microscope observation of medium-range atomic ordering in amorphous alloy
2. Image processing enhancement of high-resolution TEM micrographs of nanometer-size metal particles
3. Size of Cd(S,Se) quantum dots in glasses: Correlation between measurements by high‐resolution transmission electron microscopy, small‐angle x‐ray scattering, and low‐frequency inelastic Raman scattering
4. Theory of Electron Micrographs of Amorphous Materials
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