Intensity changes induced by beam damage in electron diffraction from behenic acid multiple monolayers
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference7 articles.
1. The reduction of radiation damage in the electron microscope
2. The effect of dose rate on imaging aromatic organic crystals
3. Electron beam damage of behenic acid films
4. The fatty acid monolayer technique for preparing frozen-hydrated specimens
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5. Fading and broadening of electron diffraction spot from beam‐damaged multiple monolayer films;Journal of Microscopy;1996-10
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