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Measurements of electron beam damage for organic crystals in a high voltage electron microscope with image plates

  • Published:2002-01 Issue:4 Volume:33 Page:403-406
  • ISSN:0968-4328
  • Container-title:Micron
  • language:en
  • Short-container-title:Micron

Author:

Ohno Tamotsu,Sengoku Masaya,Arii Tatsuo

Publisher

Elsevier BV

Subject

Cell Biology,Structural Biology,General Physics and Astronomy,General Materials Science

Reference28 articles.

1. Characteristics of imaging plates (Fuji:FDL-UR-V) and EM films for HVTEM application V;Arii;Electron Microscopy,1999

2. A new high voltage electron microscope for biological specimens;Arii,1984

3. Intensity measurement of high voltage electron microscopic images by YAG-TV recording systems;Arii;Journal of Electron Microscopy,1993

4. Characteristics of the new imaging plate (Fuji: FDL UR-V) for HVTEM II;Arii,1996

5. Characteristics of Fuji FDL 5000 imaging plate system and EM films for HVTEM applications II;Arii;Journal of Electron Microscopy,1996

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