Imaging Beam‐Sensitive Materials by Electron Microscopy-Reference-Cited by-同舟云学术

Imaging Beam‐Sensitive Materials by Electron Microscopy

Published:2020-02-28 Issue:16 Volume:32 Page:1907619
ISSN:0935-9648
Container-title:Advanced Materials
language:en
Short-container-title:Adv. Mater.

Author:

Chen Qiaoli¹,Dwyer Christian²,Sheng Guan³,Zhu Chongzhi¹,Li Xiaonian¹,Zheng Changlin⁴,Zhu Yihan¹^ORCID

Affiliation:

1. Center for Electron Microscopy State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology and College of Chemical Engineering Zhejiang University of Technology Hangzhou 310014 China

2. Department of Physics Arizona State University Tempe AZ 85287‐1504 USA

3. Advanced Membranes and Porous Materials Center Physical Science and Engineering King Abdullah University of Science and Technology Thuwal 23955‐6900 Kingdom of Saudi Arabia

4. State Key Laboratory of Surface Physics and Department of Physics Fudan University Shanghai 200438 China

Funder

National Natural Science Foundation of China

Science and Technology Commission of Shanghai Municipality

National Science Foundation

Natural Science Foundation of Zhejiang Province

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/adma.201907619