Characterization of different porous silicon structures by spectroscopic ellipsometry-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Characterization of different porous silicon structures by spectroscopic ellipsometry

Published:1996-04 Issue:1-2 Volume:276 Page:223-227
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Fried M,Lohner T,Polgár O,Petrik P,Vázsonyi É,Bársony I,Piel J.P,Stehle J.L

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference12 articles.

1. Optical studies of the structure of porous silicon films formed in p-type degenerate and non-degenerate silicon

2. Optical properties of porous silicon films

3. Spectroscopic ellipsometry characterisation of light-emitting porous silicon structures

4. Optical characterisation of porous silicon layers by spectrometric ellipsometry in the 1.5–5 eV range

5. Characterisation of porous silicon layers by spectroscopic ellipsometry

Cited by 49 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Studies of porous silicon aging by ellipsometry;Molecular Crystals and Liquid Crystals;2022-04-25

2. Optical properties of porous silicon materials;Porous Silicon for Biomedical Applications;2021

3. Porous Si Partially Filled with Water Molecules—Crystal Structure, Energy Bands and Optical Properties from First Principles;Nanomaterials;2020-02-24

4. Structure of natural film on porous silicon surface founded by ellipsometry;Molecular Crystals and Liquid Crystals;2020-02-11

5. The Structure of Oxide Film on the Porous Silicon Surface;Ukrainian Journal of Physics;2020-02-03

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3