Optical studies of the structure of porous silicon films formed in p-type degenerate and non-degenerate silicon
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering,Condensed Matter Physics
Link
http://stacks.iop.org/0022-3719/17/i=35/a=020/pdf
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2. Dielectric properties of heavily doped crystalline and amorphous silicon from 1.5 to 6.0 eV
3. Dielectric function of Si‐SiO2and Si‐Si3N4mixtures
4. Spectroscopic Analysis of the Interface Between Si and Its Thermally Grown Oxide
5. Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry
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