In situ ellipsometric studies of optical and surface properties of GaAs(100) at elevated temperatures
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference17 articles.
1. Ellipsometry and Polarized Light;Azzam,1977
2. Proc. 2nd Int. Conf. on Elec. Mats.;Yao,1991
3. Variable angle of incidence spectroscopic ellipsometry: Application to GaAs‐AlxGa1−xAs multiple heterostructures
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