Influence of substrates on the elastic reaction of films for the microindentation tests
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference13 articles.
1. Hardness measurement at penetration depths as small as 20 nm
2. A method for interpreting the data from depth-sensing indentation instruments
3. The mechanical properties and microstructure of plasma enhanced chemical vapor deposited silicon nitride thin films
4. The relation between load and penetration in the axisymmetric boussinesq problem for a punch of arbitrary profile
Cited by 155 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Intrinsic Thermomechanical Properties of Freestanding TEOS-SiO2 Thin Films Depending on Thickness;ACS Applied Electronic Materials;2024-07-05
2. Quantitative investigation on the Young's modulus of ultrathin amorphous PS films attached to different substrates;Journal of Polymer Science;2024-02-26
3. Adhesive contact mechanics of penta-twinned nanowires;Extreme Mechanics Letters;2024-01
4. Lattice Deformation at Submicron Scale: X-Ray Nanobeam Measurements of Elastic Strain in Electron Shuttling Devices;Physical Review Applied;2023-08-23
5. Abnormal Degradation Behaviors Under Negative Bias Stress in Flexible p-Channel Low-Temperature Polycrystalline Silicon Thin-Film Transistors After Laser Lift-Off Process;IEEE Transactions on Electron Devices;2023-03
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3