1. A history of ion microbeams;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1997-07
2. High resolution techniques using scanning proton microprobe (SPM);Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1994-05
3. Ion-beam-induced charge-collection imaging of CMOS ICs;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1993-06
4. Ion beam induced charge collection (IBICC) microscopy of ICs: relation to single event upsets (SEU);Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1993-05
5. Comparison of the charge collecting properties of junctions and the SEU response of microelectronic circuits;International Journal of Radiation Applications and Instrumentation. Part D. Nuclear Tracks and Radiation Measurements;1991-01