Ion beam induced charge collection (IBICC) microscopy of ICs: relation to single event upsets (SEU)
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference13 articles.
1. The nuclear microprobe and its applications to controlled fusion research
2. Nuclear microprobe imaging of single-event upsets
3. Track structure effects at p-n junctions in microelectronic circuits
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