Comparison of the charge collecting properties of junctions and the SEU response of microelectronic circuits

Author:

McNulty P.J.,Roth D.R.,Beauvais W.J.,Abdel-Kader W.G.,Dinge D.C.

Publisher

Elsevier BV

Subject

General Medicine

Reference14 articles.

1. Estimating the Dimensions of the SEU-Sensitive Volume;Abdel-Kader;IEEE Trans. Nucl. Sci.,1987

2. Satellite Anomalies from Galactic Cosmic Rays;Binder;IEEE Trans. Nucl. Sci.,1975

3. Energy Spectra of Heavy Fragments in the Interactions of Protons with Communication Materials;Hamm;IEEE Trans. Nucl. Sci.,1981

4. Alpha Particle Induced Field and Enhanced Charge of Carriers;Hu;IEEE Electron Device Lett.,1982

5. Radiation Detection and Measurements;Knoll,1989

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Basic Radiation Damage Mechanisms in Semiconductor Materials and Devices;Radiation Effects in Advanced Semiconductor Materials and Devices;2002

2. Radiation Effects and Low-Frequency Noise in Silicon Technologies;Low Temperature Electronics;2001

3. Proton induced spallation reactions;Radiation Physics and Chemistry;1994-01

4. Microdosimetry in Space Using Microelectronic Circuits;Biological Effects and Physics of Solar and Galactic Cosmic Radiation Part B;1993

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