Basic Radiation Damage Mechanisms in Semiconductor Materials and Devices-Reference-Cited by-同舟云学术

Basic Radiation Damage Mechanisms in Semiconductor Materials and Devices

Published:2002 Issue: Volume: Page:9-52
ISSN:0933-033X
Container-title:Radiation Effects in Advanced Semiconductor Materials and Devices
language:
Short-container-title:

Author:

Claeys Cor,Simoen Eddy

Publisher

Springer Berlin Heidelberg

Link

http://link.springer.com/content/pdf/10.1007/978-3-662-04974-7_2

Reference118 articles.

1. Van Lint VA, Flanahan TM, Leadon RE, Naber JA, Rogers VC (1980) Mechanisms of radiation effects in electronic materials. Wiley Interscience, New York

2. Ma TP, Dressendorfer PV (1989) Ionizing radiation effects in MOS devices and circuits. Wiley Interscience, New York

3. Adams L, Holmes-Siedle A (1993) Handbook of radiation effects. Oxford Scientific Publishers, Oxford

4. McLean FB, Oldham TR (1987) Basic mechanisms of radiation effects in electronic materials and devices. US Army Lab Command, HDL-TR-2129. US Army Command, Harry Diamond Laboratories, MD, USA

5. Oldham TR, McLean FB, Boesch Jr HE, McGarrity JM (1989) An overview of radiation-induced interface traps in MOS structures. Semicond Sci Technol 4: 986–999

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Mitigating Heavy Ion Irradiation‐Induced Degradation in p‐type SnO Thin‐Film Transistors at Room Temperature;physica status solidi (a);2023-09-07

2. Radiative and Magnetically Stimulated Evolution of Nanostructured Complexes in Silicon Surface Layers;Materials;2022-06-07

3. Comparison of the Total Dose Responses of Fully Depleted SOI nMOSFETs With Different Geometries for the Worst Case Bias Conditions;IEEE Transactions on Nuclear Science;2019-10

4. Impedance spectroscopy characterization of neutron irradiated thermoelectric modules for space nuclear power;AIP Advances;2019-05

5. TID and high energy protons tests on IR HgCdTe CMOS detectors for jovian environment;High Energy, Optical, and Infrared Detectors for Astronomy VIII;2018-07-10