Study of the system using soft X-rays
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference7 articles.
1. Ion beam analysis of the reaction of Pd with Si(100) and Si(111) at room temperature
2. Chemical bonding and reactions at the Pd/Si interface
3. Exploiting energy‐dependent photoemission in Si d‐metal interfaces: The Si(111)–Pd case
4. Metal/silicon interface formation: The Ni/Si and Pd/Si systems
5. Presence of critical Au-Film thickness for room temperature interfacial reaction between Au(film) and Si(crystal substrate)
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Structural characterization of base/collector interfaces for magnetic tunnel transistors grown on Si(001);Journal of Applied Physics;2005-05-15
2. Studies of Solid Interfaces Using Soft X-ray Emission Spectroscopy;Critical Reviews in Solid State and Materials Sciences;1998-06
3. Silicide formation at palladium surfaces. Part II: Amorphous silicide growth at the Pd(100) surface;Surface Science;1998-05
4. Silicide formation at palladium surfaces. Part I: Crystalline and amorphous silicide growth at the Pd(110) surface;Surface Science;1998-05
5. Growth of Te thin films deposited at room temperature on the Si(100)2 × 1 surface;Journal of Electron Spectroscopy and Related Phenomena;1995-02
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