Studies of Solid Interfaces Using Soft X-ray Emission Spectroscopy-Reference-Cited by-同舟云学术

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Studies of Solid Interfaces Using Soft X-ray Emission Spectroscopy

Published:1998-06 Issue:2 Volume:23 Page:65-203
ISSN:1040-8436
Container-title:Critical Reviews in Solid State and Materials Sciences
language:en
Short-container-title:Critical Reviews in Solid State and Materials Sciences

Author:

Kurmaev E. Z.,Galakhov V. R.,Shamin S. N.

Publisher

Informa UK Limited

Subject

Electrical and Electronic Engineering,Physical and Theoretical Chemistry,Condensed Matter Physics,General Chemical Engineering,Electronic, Optical and Magnetic Materials

Link

http://www.tandfonline.com/doi/pdf/10.1080/10408439891324176

Cited by 33 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Determination of the electronic and structural configuration of coordination compounds by synchrotron-radiation techniques;Coordination Chemistry Reviews;2014-10

2. Investigation of the thermal stability of Mg/Co periodic multilayers for EUV applications;Applied Physics A;2011-12-06

3. Characterization of EUV periodic multilayers;X-Ray Spectrometry;2011-07-26

4. Development and Interfacial Characterization of Co/Mg Periodic Multilayers for the EUV Range;The Journal of Physical Chemistry C;2010-03-19

5. Soft X-ray emission spectroscopy of low-dimensional SiO2 /Si interfaces after Si+ ion implantation and ion beam mixing;physica status solidi (a);2010-03

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