The determination of mbe growth mechanisms using dynamic rheed techniques
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference24 articles.
1. Analysis of reflection high-energy electron-diffraction data from reconstructed semiconductor surfaces
2. Dynamics of film growth of GaAs by MBE from Rheed observations
3. Damped oscillations in reflection high energy electron diffraction during GaAs MBE
4. RHEED oscillation studies of MBE growth kinetics and lattice mismatch strain-induced effects during InGaAs growth on GaAs(100)
5. Phase-Locked Epitaxy Using RHEED Intensity Oscillation
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