The meandering of steps and the terrace width distribution on clean Si(111)
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference28 articles.
1. Reflection electron microscopy (REM) of vicinal surfaces of fcc metals
2. Observation of surface crystallography by reflection electron microscopy
3. Transformations on clean Si(111) stepped surface during sublimation
4. Reflection electron microscopy study of structural transformations on a clean silicon surface in sublimation, phase transition and homoepitaxy
5. Surface studies by low-energy electron microscopy (LEEM) and conventional UV photoemission electron microscopy (PEEM)
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