Surface studies by low-energy electron microscopy (LEEM) and conventional UV photoemission electron microscopy (PEEM)
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference22 articles.
1. The resolution of the low energy electron reflection microscope
2. An analytical reflection and emission UHV surface electron microscope
3. Experiment and theory of the elastic electron reflection coefficient from tungsten
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5. Evaluation of Advanced Semiconductor Materials by Electron Microscopy;Bauer,1988
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