Reflection electron microscopy study of structural transformations on a clean silicon surface in sublimation, phase transition and homoepitaxy
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference30 articles.
1. 7 × 7 Reconstruction on Si(111) Resolved in Real Space
2. Reflection electron microscopy
3. The (7 × 7) ↔ (1 × 1) phase transition on Si(111)
4. Surface imaging using diffracted electrons
5. Bragg diffraction imaging of defects at crystal surfaces
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