Critical issues in the application of a gallium probe to high resolution secondary ion imaging-Reference-Cited by-同舟云学术

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Critical issues in the application of a gallium probe to high resolution secondary ion imaging

Published:1991-04 Issue:1-3 Volume:246 Page:94-106
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Levi-Setti R.,Hallégot P.,Girod C.,Chabala J.M.,Li J.,Sodonis A.,Wolbach W.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference31 articles.

1. Proc. 28th Int. Field Emission Symp.;Lam,1981

2. Secondary ion imaging in the scanning ion microscope

3. Proc. 28th Int. Field Emission Symp.;Fox,1981

4. HIGH SPATIAL RESOLUTION SIMS WITH THE UC-HRL SCANNING ION MICROPROBE

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