Secondary ion imaging in the scanning ion microscope-Reference-Cited by-同舟云学术

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Secondary ion imaging in the scanning ion microscope

Published:1983-12 Issue:1-3 Volume:218 Page:368-374
ISSN:0167-5087
Container-title:Nuclear Instruments and Methods in Physics Research
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research

Author:

Levi-Setti Riccardo,La Marche Paul H.,Lam Kin,Shields Thomas H.,Wang Yuh-Lin

Publisher

Elsevier BV

Subject

General Engineering

Reference22 articles.

1. Electronics and electron physics;Levi-Setti,1980

2. High resolution scanning ion probes: Applications to physics and biology

3. Proc. 29th Int. Field emission Symp.;Waugh,1982

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3. High Resolution Secondary Ion Mass Spectroscopy Imaging;Encyclopedia of Imaging Science and Technology;2002-01-15

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5. Stable field-induced electron emission from a solidified liquid metal ion source;Applied Physics Letters;1998-01-19

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