Information depth in Auger electron spectroscopy
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference21 articles.
1. Editorial
2. Backscattering correction for quantitative Auger analysis
3. Backscattering correction for quantitative Auger analysis
4. Escape depth of auger electrons; the elastic scattering effect
5. The elastic scattering factor in Auger electron spectroscopy
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1. EELS peak intensity dependence on primary electron energy for the Si(111)7×7 and Si(111)-Cr surface structures;Surface Science;1999-05
2. Evaluation of Calculated and Measured Electron Inelastic Mean Free Paths Near Solid Surfaces;Journal of Physical and Chemical Reference Data;1999-01
3. Generalized model for interface description;Surface Science;1998-05
4. Proton-induced Auger electrons from ultrathin Mn films on Fe(100);Surface Science;1998-05
5. Spectroscopy of the Cu L3M4,5M4,5 Auger line excited by grazingly incident MeV protons on Cu(110);Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-07
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