Backscattering correction for quantitative Auger analysis
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference9 articles.
1. Backscattering correction for quantitative Auger analysis
2. Study of preferential sputtering on binary alloy by in-situ Auger measurement of sputtered and sputter-deposited surfaces
3. Auger study of preferred sputtering on binary alloy surfaces
4. Method of Surface Analysis;Wehner,1975
5. Sputtering of the alloy systems AgAu, AuCu, and AgCu studied by Auger electron spectroscopy
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