Submicron particle analysis by the Auger microprobe (FE-SAM)-Reference-Cited by-同舟云学术

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Submicron particle analysis by the Auger microprobe (FE-SAM)

Published:1996-07 Issue: Volume:100-101 Page:152-155
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Ito Hisaji,Ito Mototaka,Magatani Y.,Soeda F.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference10 articles.

1. Schottky field emission based scanning Auger microprobe

2. Low-energy field emission Auger electron spectroscopy

3. Monte Carlo calculations of the spatial resolution in a scanning auger electron microscope

4. Edge effect in high‐resolution scanning Auger‐electron microscopy

5. High spatial resolution Auger linescans across heterogeneous chemical edges by Monte Carlo calculation

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Oxygen inward diffusion and complex reorganization of the reaction layer in ion-exchanged glasses evidenced by Auger electron spectroscopy;Solid State Ionics;2024-01

2. Lateral Resolution of Imaging Surface-Analytical Instruments as SIMS, AES and XPS: Application of the BAM-L200 Certified Reference Material and Related ISO Standards;Journal of Surface Analysis;2017

3. High-resolution imaging with SEM/T-SEM, EDX and SAM as a combined methodical approach for morphological and elemental analyses of single engineered nanoparticles;RSC Adv.;2014-10-07

4. Investigation of silica nanoparticles by Auger electron spectroscopy (AES);Surface and Interface Analysis;2014-01-16

5. Monte Carlo simulation study of scanning Auger electron images;Journal of Applied Physics;2009-07-15

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