Monte Carlo simulation study of scanning Auger electron images
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3183936
Reference53 articles.
1. Quantitative surface chemical mapping with Auger and backscattered electron signals
2. The effect of backscattered electrons on the resolution of scanning Auger microscopy
3. Auger electron spectroscopy and microscopy with probe‐size limited resolution
4. Nanometer-resolution scanning Auger electron microscopy
5. Scanning reflection electron microscopy and associated techniques for surface studies
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