Quantitative surface chemical mapping with Auger and backscattered electron signals
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference31 articles.
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Cited by 14 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Scanning Electron and Auger Microscopy of Surfaces and Small Particles;Encyclopedia of Surface and Colloid Science, Third Edition;2015-12-04
2. Monte Carlo simulation study of scanning Auger electron images;Journal of Applied Physics;2009-07-15
3. High spatial resolution studies of surfaces and small particles using electron beam techniques;Journal of Electron Spectroscopy and Related Phenomena;2005-05
4. Effect of backscattered electrons on the analysis area in scanning Auger microscopy;Applied Surface Science;2004-05
5. From LEED to MULSAM;Surface and Interface Analysis;2000
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