Epitaxial growth of CoSi2/Si structures
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
Reference71 articles.
1. Evaluation of Advanced Semiconductor Materials by Electron Microscopy;Tung,1988
2. Growth of CoSi2 on Si(001): Structure, defects, and resistivity
3. Epitaxial growth of transition-metal silicides on silicon
4. Low Schottky barrier of rare‐earth silicide onn‐Si
5. Infrared response from metallic particles embedded in a single‐crystal Si matrix: The layered internal photoemission sensor
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1. Formation and magnetic properties of ultrathin cobalt silicides films on Si surface;ST PETER POLY U J-PH;2023
2. Correlated TKD/EDS - TEM - APT analysis on selected interfaces of CoSi2 thin films;Ultramicroscopy;2019-11
3. The (2×2) reconstructions on the surface of cobalt silicides: Atomic configuration at the annealed Co/Si(111) interface;Surface Science;2017-08
4. Scanning tunneling microscopy observation of ultrathin epitaxial CoSi2(111) films grown at a high temperature;Technical Physics;2015-10
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