Backscattering and transmission electron microscopy studies of layered structures-Reference-Cited by-同舟云学术

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Backscattering and transmission electron microscopy studies of layered structures

Published:1980-02 Issue:2 Volume:1 Page:141-144
ISSN:0379-6787
Container-title:Solar Cells
language:en
Short-container-title:Solar Cells

Author:

Mayer J.W.

Publisher

Elsevier BV

Subject

General Engineering

Reference9 articles.

1. Backscattering Spectrometry;Chu,1978

2. Material Characterization Using Ion Beams,1977

3. Thin Films-Interdiffusion and Reactions,1978

4. Dechannelling of MeV He ions by twinned regions in implanted Si crystals

5. Investigation of dislocations by backscattering spectrometry and transmission electron microscopy

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Analysis of depth profiles of sol-gel derived multilayer coatings by Rutherford backscattering spectrometry and by cross-sectional transmission electron microscopy1;Journal of Materials Research;1991-04

2. Microstructure and growth kinetics of CrSi2 on Si{100} studied using cross-sectional transmission electron microscopy;Thin Solid Films;1985-01

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