Investigation of dislocations by backscattering spectrometry and transmission electron microscopy

Author:

Tseng W.F.,Gyulai J.,Koji T.,Lau S.S.,Roth J.,Mayer J.W.

Publisher

Elsevier BV

Subject

General Medicine

Reference10 articles.

1. Dechannelling Cylinder of Dislocations

2. Proc. Conf. on Atomic collision phenomena in solids;Morgan,1970

3. The computer simulation and classical interpretation of fast ion emission profiles near planes

4. Proc. on Atomic collision phenomena in solids;Delsarte,1970

5. Proc Conf. on Ion implantation in semiconductor and other materials;Foti,1976

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