On the origin of deep oxygen defects in hydrogenated nanocrystalline silicon thin films used in photovoltaic applications-Reference-Cited by-同舟云学术

On the origin of deep oxygen defects in hydrogenated nanocrystalline silicon thin films used in photovoltaic applications

Published:2013-06 Issue: Volume:113 Page:61-70
ISSN:0927-0248
Container-title:Solar Energy Materials and Solar Cells
language:en
Short-container-title:Solar Energy Materials and Solar Cells

Author:

Fields J.D.,Gorman B.,Merdzhanova T.,Yan B.,Su T.,Taylor P.C.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

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