Excitation wavelength dependence of Raman scattering and substrate dependence on hydrogenated silicon-based thin film-Reference-Cited by-同舟云学术

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Excitation wavelength dependence of Raman scattering and substrate dependence on hydrogenated silicon-based thin film

Published:2018-09 Issue: Volume:545 Page:315-322
ISSN:0921-4526
Container-title:Physica B: Condensed Matter
language:en
Short-container-title:Physica B: Condensed Matter

Author:

Zhu Jun,Wang Quan

Funder

Suzhou Science &Technology Program

Jiangsu Province Postdoctoral Science Foundation

Starting Foundation of Jiangsu University Advanced Talent

Jiangsu Key Laboratory of New Technology for Road Vehicles

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference20 articles.

1. Improved thermoelectric properties of nano-crystalline hydrogenated silicon thin films by post-deposition thermal annealing;Loureiro;Thin Solid Films,2017

2. Hydrogenated nano-crystalline silicon thin films with promising thermoelectric properties;Loureiro;Appl. Phys. A,2015

3. Complex nano-patterning of structural, optical, electrical and electron emission properties of amorphous silicon thin films by scanning probe;Fait;Appl. Surf. Sci.,2018

4. Effects of phosphorus on the electrical characteristics of plasma deposited hydrogenated amorphous silicon carbide thin films;Alcinkaya;Solid State Electron.,2018

5. High electron mobility in well-ordered and lattice-strained hydrogenated nano-crystalline silicon;Chen;Nanotechnology,2006

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