A re-examination of thin-film silicon’s Raman spectrum
Author:
Funder
Natural Sciences and Engineering Research Council of Canada
Publisher
Springer Science and Business Media LLC
Link
https://link.springer.com/content/pdf/10.1007/s10854-024-12616-2.pdf
Reference90 articles.
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4. M. Güneş, J. Melskens, A.H.M. Smets, The native and metastable defects and their joint density of states in hydrogenated amorphous silicon obtained from the improved dual beam photoconductivity method. J. Appl. Phys. 133, 125702-1-18 (2023)
5. J.E. Smith Jr., M.H. Brodsky, B.L. Crowder, M.I. Nathan, A. Pinczuk, Raman spectra of amorphous Si and related tetrahedrally bonded semiconductors. Phys. Rev. Lett. 26, 642–646 (1971)
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