Selective chemical wet etching of Si1-xGex versus Si in single-layer and multi-layer with HNO3/HF mixtures

Author:

Choi Yongjoon,Jang HyunchulORCID,Byun Dae-seop,Ko Dae-HongORCID

Funder

MOTIE

KSRC

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference47 articles.

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3. Si nanowire CMOS fabricated with minimal deviation from RMG FinFET technology showing record performance;Lauer,2015

4. Vertically stacked-nanowires MOSFETs in a replacement metal gate process with inner spacer and SiGe source/drain;Barraud,2017

5. Role of N2 addition on CF4 / O2 remote plasma chemical dry etching of polycrystalline silicon;Matsuo;J. Vac. Sci. Technol. A,1997

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