Recent achievements in the reliability of InP-based HEMTs

Author:

Suemitsu Tetsuya

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference32 articles.

1. 31st International Reliability Physics Symposium, March 23–25;LaCombe,1993

2. Reliability of metamorphic HEMTs on GaAs substrates

3. GaAs MANTECH Conference, Scottsdale, AZ, USA, May 19–22;Chertouk,2003

4. Reliability investigation of 0.07-μm InGaAs-InAlAs-InP HEMT MMICs with pseudomorphic In0.75Ga0.25As channel

5. 2004 International Electron Devices Meeting, San Francisco, U.S.A., December 13–15, 2004, IEDM Technical Digest;del Alamo,2004

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