1. Baird, H.S., 1990. Document image defect models. In: Proceedings of the IAPR Workshop on Syntactic and Structural Pattern Recognition Murray Hill, New Jersey, pp. 13–15. Reprinted in: Baird, H.S., Bunke, H., Yamamoto, K. (Eds.), 1992. Structured Document Image Analysis. Springer, New York, pp. 546–556
2. Baird, H.S., 1993. Calibration of document image defect models. In: Proceedings of the Second Annual Symposium on Document Analysis and Information Retrieval, Las Vegas, Nevada, pp. 1–16
3. Large-scale simulation studies in image pattern recognition;Ho;IEEE Trans. Pattern Analysis and Machine Intelligence,1997
4. Jain, A.K., 1989. Fundamentals of Digital Image Processing. Prentice Hall, Englewood Cliffs, NJ
5. Bar code waveforms recognition using peak locations;Joseph;IEEE Trans. Pattern Analysis and Machine Intelligence,1994