Document Image Defect Models-Reference-Cited by-同舟云学术

Document Image Defect Models

Published:1992 Issue: Volume: Page:546-556
ISSN:
Container-title:Structured Document Image Analysis
language:
Short-container-title:

Author:

Baird Henry S.

Publisher

Springer Berlin Heidelberg

Link

http://link.springer.com/content/pdf/10.1007/978-3-642-77281-8_26.pdf

Reference9 articles.

1. H. S. Baird, “Feature Identification for Hybrid Structural/Statistical Pattern Classification,” Computer Vision, Graphics, & Image Processing 42, pp. 318–333, 1988.

2. H. S. Baird, “Global-to-Local Layout Analysis,” Proc. IAPR Workshop on Syntactic and Structural Pattern Recognition, Pont-a-Mousson, France, 12–14 September, 1988.

3. M. P. Ekstrom, Digital Image Processing Techniques, Academic Press (Orlando, 1984 ).

4. R. Fossey and P. Lofting, “The Typestyle Jockey: Putting the Horse Out Front in Devanagari and Tibetan,” Nordic Institute of Asian Studies Report, Copenhagen, pp. 5–30, 1990.

5. D. Lee, T. Pavlidis, and G. W. Wasilkowski, “A Note on the Trade-off between Sampling and Quantization in Signal Processing,” J. of Complexity, Vol. 3, pp. 359–371, 1987.

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