Determination of trace elements in high-purity quartz samples by ICP-OES and ICP-MS: A normal-pressure digestion pretreatment method for eliminating unfavorable substrate Si-Reference-Cited by-同舟云学术

Determination of trace elements in high-purity quartz samples by ICP-OES and ICP-MS: A normal-pressure digestion pretreatment method for eliminating unfavorable substrate Si

Published:2020-05 Issue: Volume:1110 Page:11-18
ISSN:0003-2670
Container-title:Analytica Chimica Acta
language:en
Short-container-title:Analytica Chimica Acta

Author:

Dong Xuelin,Xiong Yuxiang,Wang Nan^ORCID,Song Zhou,Yang Jie,Qiu Xiumei,Zhu Lihua

Funder

Scientific Research Project of Ministry of Land and Resources in Hubei Province, China

Research on geological technology and application of Hubei province

Open Fund of Key Laboratory of Rare and Rare and Rare Minerals

Ministry of Natural Resources

Publisher

Elsevier BV

Subject

Spectroscopy,Environmental Chemistry,Biochemistry,Analytical Chemistry

Reference33 articles.

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3. Crystalline silicon feedstock for solar cells;Aulich;Prog. Photovoltaics Res. Appl.,2002

4. Silicon feedstock for the multi-crystalline photovoltaic industry;Dominique Sarti;Sol. Energy Mater. Sol. Cells,2002

5. Secondary Ion Mass Spectrometry for the quantification of multiple minor and trace elements in forsterite–fayalite;Bulle;Int. J. Mass Spectrom.,2014

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