Author:
Liu Weihua,Wu Fei,Zhang Meng,Wang Yifei,Lu Zhonghai,Lu Xiangfeng,Xie Changsheng
Cited by
33 articles.
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1. Minato: A Read-Disturb-Aware Dynamic Buffer Management Scheme for NAND Flash Memory;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2024-07
2. Modeling Retention Errors of 3D NAND Flash for Optimizing Data Placement;ACM Transactions on Design Automation of Electronic Systems;2024-06-21
3. Performance Improvement of Flash Memory By Error Pre-checking Scheme and Error Correction;2024 1st International Conference on Trends in Engineering Systems and Technologies (ICTEST);2024-04-11
4. Improving Read Performance for LDPC-Based SSDs with Adaptive Bit Labeling on $V_{th}$ States;2023 IEEE 29th International Conference on Embedded and Real-Time Computing Systems and Applications (RTCSA);2023-08-30
5. Neural Network Based Threshold Voltage Model for 3D TLC NAND Flash;2023 IEEE 16th International Conference on Electronic Measurement & Instruments (ICEMI);2023-08-09