Abstract
The Ge<sub>50</sub>Te<sub>50</sub>/Zn<sub>15</sub>Sb<sub>85</sub> nanocomposite multilayer films are prepared by the magnetron sputtering. The variation of resistance with temperature and with crystallization activation energy is studied. The multilayer structure of the section before and after the crystallization for Ge<sub>50</sub>Te<sub>50</sub>/Zn<sub>15</sub>Sb<sub>85</sub> nanocomposite multilayer film is compared by transmission electron microscope. The phase change memory device based on [GT(7nm)/ZS(3nm)]<sub>5</sub> is manufactured, and the electrical performance is measured. The fast switching speed, low operating power consumption, and good cycling performance are achieved for Ge<sub>50</sub>Te<sub>50</sub>/Zn<sub>15</sub>Sb<sub>85</sub>. Ge<sub>50</sub>Te<sub>50</sub>/Zn<sub>15</sub>Sb<sub>85</sub>, which is a kind of nanocomposite multilayer film, a promising phase change storage material with high thermal stability and low power consumption.
Publisher
Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences
Subject
General Physics and Astronomy
Cited by
1 articles.
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