Study the effect of silver ion implantation on the structural, optical, and electrical properties of copper oxide thin films: an experimental and theoretical approach-Reference-Cited by-同舟云学术

Study the effect of silver ion implantation on the structural, optical, and electrical properties of copper oxide thin films: an experimental and theoretical approach

Published:2021-09 Issue:9 Volume:136 Page:
ISSN:2190-5444
Container-title:The European Physical Journal Plus
language:en
Short-container-title:Eur. Phys. J. Plus

Author:

Ahmad Riaz^ORCID,Anjum Faiza,Gillani S. S. A.,Iqbal M. Waqas,Zafar Kanza,Ikhlaque Uzma,Saleem Sehrish,Naeem Mahrukh

Funder

higher education commision, pakistan

Publisher

Springer Science and Business Media LLC

Subject

General Physics and Astronomy

Link

https://link.springer.com/content/pdf/10.1140/epjp/s13360-021-01912-z.pdf

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