Silicon–van der Waals heterointegration for CMOS-compatible logic-in-memory design

Author:

Lee Mu-Pai1ORCID,Gao Caifang2ORCID,Tsai Meng-Yu34ORCID,Lin Che-Yi3ORCID,Yang Feng-Shou3,Sung Hsin-Ya1,Zhang Chi25ORCID,Li Wenwu25ORCID,Li Jun6ORCID,Zhang Jianhua6ORCID,Watanabe Kenji7ORCID,Taniguchi Takashi8ORCID,Ueno Keiji9ORCID,Tsukagoshi Kazuhito10,Ho Ching-Hwa11ORCID,Chu Junhao25ORCID,Chiu Po-Wen4ORCID,Li Mengjiao6ORCID,Wu Wen-Wei1ORCID,Lin Yen-Fu312ORCID

Affiliation:

1. Department of Materials Science and Engineering, National Yang Ming Chiao Tung University, Hsinchu 30010, Taiwan.

2. Shanghai Frontiers Science Research Base of Intelligent Optoelectronics and Perception, Institute of Optoelectronics, Fudan University, Shanghai 200433, China.

3. Department of Physics, National Chung Hsing University, Taichung 40227, Taiwan.

4. Institute of Electronics Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan.

5. State Key Laboratory of Photovoltaic Science and Technology, Department of Materials Science, Fudan University, Shanghai 200433, China.

6. School of Microelectronics, Shanghai University, Jiading, Shanghai 201800, China.

7. Research Center for Electronic and Optical Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan.

8. Research Center for Materials Nanoarchitectonics, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan.

9. Department of Chemistry, Graduate School of Science and Engineering, Saitama University, Saitama 338-8570, Japan.

10. International Center for Materials Nanoarchitectonics, National Institute for Materials Science, Tsukuba 305-0044, Japan.

11. Graduate Institute of Applied Science and Technology, National Taiwan University of Science and Technology, Taipei 106, Taiwan.

12. Department of Material Science and Engineering, Institutes of Nanoscience, i-Center for Advanced Science and Technology (i-CAST), National Chung Hsing University, Taichung 40227, Taiwan.

Abstract

Silicon CMOS-based computing-in-memory encounters design and power challenges, especially in logic-in-memory scenarios requiring nonvolatility and reconfigurability. Here, we report a universal design for nonvolatile reconfigurable devices featuring a 2D/3D heterointegrated configuration. By leveraging the photo-controlled charge trapping/detrapping process and the partially top-gated energy band landscape, the van der Waals heterostacking achieves polarity storage and logic reconfigurable characteristics, respectively. Precise polarity tunability, logic nonvolatility, robustness against high temperature (at 85°C), and near-ideal subthreshold swing (80 mV dec −1 ) can be done. A comprehensive investigation of dynamic charge fluctuations provides a holistic understanding of the origins of nonvolatile reconfigurability (a trap level of 10 13 cm −2 eV −1 ). Furthermore, we cascade such nonvolatile reconfigurable units into a monolithic circuit layer to demonstrate logic-in-memory computing possibilities, such as high-gain (65 at V dd = 0.5 V) logic gates. This work provides an innovative 3D heterointegration prototype for future computing-in-memory hardware.

Publisher

American Association for the Advancement of Science (AAAS)

Subject

Multidisciplinary

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