Detection of microarc discharge using a high-speed load impedance monitoring system
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering
Link
http://stacks.iop.org/1882-0786/7/i=9/a=096102/pdf
Reference29 articles.
1. Wafer level microarcing model in 90nm chemical-vapor deposition low-k via etch on 300mm silicon-on-insulator substrate
2. Micro Arc Monitoring by Detecting Charge Build-Up on Glass Surface of Viewing Port due to Plasma Dispersion in Plasma Processing Equipment
3. Defect reduction through statistical process control and prior-level subtraction analysis
4. Studies on Magnetron Sputtering Assisted by Inductively Coupled RF Plasma for Enhanced Metal Ionization
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3. Injection-Locked Magnetron Using a Cross-Domain Analyzer;IEEE Microwave and Wireless Components Letters;2016-11
4. Monitoring of Condition of Deposited Film Causing Particles in Plasma Etching by Using Practical Load Impedance Monitoring Method;Journal of the Vacuum Society of Japan;2016
5. Feasibility study of monitoring of plasma etching chamber conditions using superimposed high-frequency signals on rf power transmission line;Review of Scientific Instruments;2015-10
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