Energy-Filtered Secondary-Electron Imaging for Nanoscale Dopant Mapping by Applying a Reverse Bias Voltage
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
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1. Energy Selected Secondary Electron Image Revealing Surface Potential by High Accelerating Voltage Scanning Electron Microscope;Microscopy and Microanalysis;2018-08
2. Surface potential investigation on interdigitated back contact solar cells by Scanning Electron Microscopy and Kelvin Probe Force Microscopy: Effect of electrical bias;Solar Energy Materials and Solar Cells;2017-03
3. Information or resolution: Which is required from an SEM to study bulk inorganic materials?;Scanning;2016-07-11
4. Exploring backscattered imaging in low voltage FE-SEM;Journal of Physics: Conference Series;2015-10-12
5. Voltage and Dopant Concentration Measurements of Semiconductors using a Band-Pass Toroidal Energy Analyzer Inside a Scanning Electron Microscope;Microscopy and Microanalysis;2015-07-30
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