Exploring backscattered imaging in low voltage FE-SEM
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy
Link
http://stacks.iop.org/1742-6596/644/i=1/a=012019/pdf
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1. Imaging of specimens at optimized low and very low energies in scanning electron microscopes
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4. Energy-Filtered Secondary-Electron Imaging for Nanoscale Dopant Mapping by Applying a Reverse Bias Voltage
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