Design and application of a mobile miniature current probe for analysing the cause of EMI noise in IC circuits-Reference-Cited by-同舟云学术

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Design and application of a mobile miniature current probe for analysing the cause of EMI noise in IC circuits

Published:2017-08 Issue:5 Volume:11 Page:655-665
ISSN:1751-8830
Container-title:IET Science, Measurement & Technology
language:en
Short-container-title:IET Science, Measurement & Technology

Author:

Lin Han‐Nien¹,Chen Hung‐Chi²,Kuo Chung‐Wei²,Chang Yen‐Tang³

Affiliation:

1. Department of Communications EngineeringFeng‐Chia University100 Wen‐Hwa RoadTaichung40724Taiwan

2. Ph.D. Program of Electrical and Communications EngineeringFeng‐Chia University100 Wen‐Hwa RoadTaichung40724Taiwan

3. Bureau of Standards, Metrology and InspectionMinistry of Economic AffairsJinan Road, Zhongzheng DistrictTaipei CityTaiwan

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1049/iet-smt.2016.0348

Reference24 articles.

1. Electromagnetic interference noise suppression of writing/reading flash memory with multiple‐execution control program

2. Modeling and Analysis of Through-Silicon Via (TSV) Noise Coupling and Suppression Using a Guard Ring

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