Electromagnetic interference noise suppression of writing/reading flash memory with multiple‐execution control program-Reference-Cited by-同舟云学术

Electromagnetic interference noise suppression of writing/reading flash memory with multiple‐execution control program

Published:2015-11 Issue:8 Volume:9 Page:1032-1038
ISSN:1751-8830
Container-title:IET Science, Measurement & Technology
language:en
Short-container-title:IET Science, Measurement & Technology

Author:

Lin Han‐Nien¹,Kuo Chung‐Wei²,Chen Hung‐Chi²

Affiliation:

1. Department of Communications EngineeringFeng‐Chia University100 Wen‐Hwa RoadTaichung40724Taiwan

2. Ph.D. Program of Electrical and Communications EngineeringFeng‐Chia University100 Wen‐Hwa RoadTaichung40724Taiwan

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1049/iet-smt.2015.0078

Reference22 articles.

1. SAE J1752/3:‘Measurement of Radiated Emissions from Integrated Circuits – TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz) Wideband TEM Cell (150 kHz to 8 GHz)’ 2003

2. ‘ZVEI ‐ Generic IC EMC Test Specification (english)’: available athttp://www.zvei.org/Publikationen/Generic%20IC%20EMC%20Test%20Specification.pdf accessed 21 June 2015

3. ‘Powering the Future of Automotive Innovation’: available athttp://components‐asiapac.arrow.com/file_system/intranet/NEWS/TIME/id_89/Spansion_Feb_en.pdf accessed 14 January 2015

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