A two‐turn loop active magnetic field probe design for high sensitivity near‐field measurement-Reference-Cited by-同舟云学术

A two‐turn loop active magnetic field probe design for high sensitivity near‐field measurement

Published:2021-10-03 Issue:1 Volume:16 Page:40-49
ISSN:1751-8822
Container-title:IET Science, Measurement & Technology
language:en
Short-container-title:IET Science Measure & Tech

Author:

Shao Weiheng¹²^ORCID,Li Jianke²^ORCID,Huang Quan²^ORCID,Shao E²^ORCID,Liu Jiesheng¹²^ORCID,He Xiao²³^ORCID,Yi Zhiqiang²⁴^ORCID,Fang Wenxiao²^ORCID,Zhou Changjian¹^ORCID

Affiliation:

1. School of Microelectronics South China University of Technology Guangzhou China

2. China Electronic Product Reliability and Environmental Testing Research Institute Guangzhou China

3. University of Electronic Science and Technology of China Chengdu China

4. School of Information Engineering Southwest University of Science and Technology MianYang China

Funder

National Natural Science Foundation of China

Natural Science Foundation of Guangdong Province

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1049/smt2.12083

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