Author:
Hamdioui S.,van de Goor Ad J.,Delos Reyes J.,Rodgers M.
Publisher
Institution of Engineering and Technology (IET)
Subject
Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science
Reference44 articles.
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2. van de Goor, A.J.: ‘Testing semiconductor memories, theory and practice’, 2nd(ComTex Publishing, Gouda, The Netherlands 1998)
3. Comments on "An Optimal Algorithm for Testing Stuck-at Faults in Random Access Memories"
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