Comments on "An Optimal Algorithm for Testing Stuck-at Faults in Random Access Memories"-Reference-Cited by-同舟云学术

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Comments on "An Optimal Algorithm for Testing Stuck-at Faults in Random Access Memories"

Published:1979-03 Issue:3 Volume:C-28 Page:258-261
ISSN:0018-9340
Container-title:IEEE Transactions on Computers
language:
Short-container-title:IEEE Trans. Comput.

Author:

Nair

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science,Software

Link

http://xplorestaging.ieee.org/ielx5/12/35179/01675331.pdf?arnumber=1675331

Cited by 46 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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