Affiliation:
1. Department of Computer EngineeringKing Fahad University for Petroleum and MineralsDhahranSaudi Arabia
Funder
King Fahd University of Petroleum and Minerals
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Reference19 articles.
1. Single Event Transients in Digital CMOS—A Review
2. Dixit A. Wood A.: ‘The impact of new technology on soft error rates’.Proc. Int. Reliability Physics Symp. Monterey CA April2011 pp.5B.4.1–5B.4.7
3. Shivakumar P. Kistler M. Keckler S. et al.: ‘Modeling the effect of technology trends on the soft error rate of combinational logic’.Proc. Int. Conf. on Dependable Systems and Networks Washington DC 2002 pp.389–398
4. Henkel J. Bauer L. Dutt N. et al.: ‘Reliable on‐chip systems in the nano‐era: lessons learnt and future trends’.Proc. of the 50th Annual Design Automation Conf. Austin TX May2013 pp.99 : 1–99 : 10
5. A generalized modular redundancy scheme for enhancing fault tolerance of combinational circuits;El‐Maleh A.H.;Microelectron. Reliab.,2014
Cited by
8 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献