A frequency mapping method for locating functional units inside ICs based on coaxial microscope-Reference-Cited by-同舟云学术

A frequency mapping method for locating functional units inside ICs based on coaxial microscope

Published:2021-11-18 Issue:3 Volume:58 Page:115-117
ISSN:0013-5194
Container-title:Electronics Letters
language:en
Short-container-title:Electronics Letters

Author:

Liu Pengcheng¹²^ORCID,Han Jianwei¹²,Ma Yingqi¹²,Zhang Feng³,Wu Zongguo³,Zhu Xiang¹²,Cui Yixin¹²

Affiliation:

1. Space Environment Effects Laboratory National Space Science Center, Chinese Academy of Sciences Beijing China

2. School of Astronomy and Space Science University of Chinese Academy of Sciences Beijing China

3. National Engineering & Technology Research Center for ASIC Design Institute of Automation, Chinese Academy of Sciences Beĳing China

Funder

Beijing Municipal Science and Technology Commission

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1049/ell2.12373

Reference10 articles.

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2. Simple photonic emission analysis of AES

3. A method for fault recognition in the last three rounds of Advanced Encryption Standard

4. Subramanyan P. Tsiskaridze N. Pasricha K. Reisman D. Susnea A. Malik S.: In:Reverse engineering digital circuits using functional analysis. In: 2013 Design Automation & Test in Europe Conference & Exhibition (DATE) Grenoble France 18—20 March2013https://doi.org/10.7873/DATE.2013.264

5. Chef S. Chua C.T. Tay J.Y. Siah Y.W. Bhasin S. Breier J. Gan C.L.:Descrambling of embedded SRAM using a laser probe. In:2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). Singapore 16—19 July2018https://doi.org/10.1109/IPFA.2018.8452604

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